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  • UV-Vis and infrared spectroscopy
  • Variable angle spectroscopic ellipsometer
  • X-ray photoelectron spectroscopy
  • Janis probe Station for charge transport measurement
  • Atomic force microscopy
  • Ultrafast spectroscopy
  • Photovoltaic characterization equipment

Photovoltaic Characterization facility

An A.M. 1.5G simulated solar light is cSolar simulatoroupled into the glove box from an Oriel solar simulator (Oriel Sol3A Class AAA) to characterize the current-voltage characteristics of organic solar cells (OPVs). The Oriel Sol3A simulators is certified to IEC 60904-9 Edition 2 (2007), JIS C 8912, and ASTM E 927-05 standards for Spectral Match, Non-Uniformity of Irradiance, and Temporal Instability of Irradiance. A Variable aperture accessory provides user the ability to vary the illumination without adjusting the power supply. The range of attenuation is infinitely variable from 0.1 – 1 Sun.

 

UV-Vis and Infrared Spectroscopy

Agilent UV-spectrophotometer from Varian is used for the ground state absorption measurement in the spectral rangeUV-Vis and PL 200-1100 nm. Temperature dependent UV-Vis (77-393 K for solution samples and 293-393 K for thin film samples can be carried out using this set up.
The steady state photoluminescence (PL) spectra (77 K to room temperature) in the UV-NIR spectral are recorded using an Edinburgh Luminescence Spectrometer (Model: F900) equipped with a xenon lamp (Xe 900, xenon arc lamp that emits continuous radiation from 230 nm to 2600 nm). The samples can be excited with wavelength of interest and the emitted PL was detected using the photomultiplier tube (PMT). This set up can also be used to performed excitation dependence photoluminescence spectrum. We can measure the PL spectra from 400 nm to 1700 nm using this setup.

 

Variable Angle Spectroscopic Ellipsometer

J A Woollam Co. model M2000 used to analyze thin film structural and optical properties including thickness, segregation character of multicomponent films, and complex refractive indices. The instrument is equipped with a deuterium and halogen lamp providing a large optical range from 193 nm to 1690 nm. The instrument is equipped with optional focusing probes with beam diameter of 300 mm. The system is also equipped with a custom heating stage and blade coater. The blade coater enables in-situ characterization of film properties during solidification from solution.

Questions? Need access or training to this Instrument?

Contact Brendan O’Connor at brendan_oconnor@ncsu.edu

VASE

Figure. J A Woollam M2000 variable angle spectroscopic ellipsometer with (a) custom heating stage for in-situ measurement, and (b) blade coater setup.

 

Flash DSC – Flash Differential Scanning Calorimeter

Flash DSCOur TOLEDO’s Flash DSC is ideal for rapid-scanning. The instrument can analyze reorganization processes that were previously impossible to measure. The Flash DSC is the ideal complement to conventional DSC. Heating rates now cover a range of more than 7 decades.

The ultra-high heating and cooling rates add a new dimension to the study of thermally induced physical transitions and chemical processes, for example, the crystallization and reorganization of polymers.

Questions? Need access or training to this Instrument?

Contact Masoud Ghasemi at mghasem@ncsu.edu

 

 

 

X-ray Photo-electron Spectroscopy

The Riber X-ray Photoelectron SXPSpectroscopy instrument is a surface sensitive analysis tool which can measure the elemental and chemical composition of a sample.  It measures the kinetic energy of photoemitted core electrons from atoms ~5-10 nm deep which gives information about the bonding configuration of the near-surface atoms.

 

Specifications

  • Spot size: 2-3 mm diameter
  • Sample size: 1 cm2
  • Excitation source: Mg Kα (1253.6 eV)
  • Detection limits: 0.1 – 1.0 %
  • 5 slot sample holder
  • Typical pump down time ~ 2 hrs
  • Resolution ~0.1 eV

Questions? Need access or training to this Instrument?

Contact either Andy Hewitt at ashewitt@ncsu.edu or Sean Stuart at scstuart@ncsu.edu

 

Janis Probe Station for Charge Transport Measurements

A commercial proProbe stationbe station (Janis) with 4 independent micrometers for positioning needle probes inside a turbo-pumped high vacuum chamber is employed to characterize charge transport in organic films. The electrical probes are coupled to triaxial feedthroughs on an electrically isolatable cold stage. Cooling is provided by a cryogen-free Gifford-McMahon refrigerator and allows access to temperatures as low as 5K using only gaseous He.

Questions? Need access or training to this Instrument?

Contact either Abay Dinku  at agdinku@ncsu.edu or Sara Pazoki  at sjafari@ncsu.edu

 

 

 

 

 

Atomic Force Microscopy

Atomic Force Microscopy (AFM) data is acquired using the MFP-3D-BIO commercial instrument by Asylum  Research. This instrument features a variety of scan modes, scan sizes of ~1 um up to 90 um, and can obtain sub-nanometer resolution both laterally and vertically.

Scan modes

  • Contact Mode Topography
  • AC Air Topography (High quality topography with minimum damage to “soft” materials)
  • Conducting AFM (in-situ sample illumination coming soon)
  • Electric Field Microscopy
  • Magnetic Field Microscopy
  • Scanning Kelvin Probe Microscopy (measures electrostatic potential on the surface)

Questions? Need access to this Instrument? Contact Sara Pazoki  at sjafari@ncsu.edu

 

Ultrafast Spectroscopy

(1) Transient Pump Probe Spectroscopy
The pump beam at 1 KHz repetition rate (any wavelength from 270 nm to 3200 nm) is generated by a commerciFast Spec-1ally available optical parametric amplifier pumped by a Ti:sapphire regenerative amplifier. Pulse laser excitation is then followed by a second broad band (350-1600 nm) generated in a CaF2 or sapphire or flint glass. A HELIOS transient absorption spectrometer is used for recording the dynamics of transient absorption spectra upto 6.8 ns with about 200 fs instrument response.

 

 

 

 

(2) Time Resolved Second Harmonic Generation (TR-SHG) and Transient Pump probe Microscopy
TR-SHG experiments are performed using a Ti- Sapphire laser (250 KHz, 800 nm) to study interface properties. The outpTime Resolved Second Harmonic Generationut of regenerative amplifier is split into two beams: one as probe (800 nm) and the other to generate a tunable pump beam (500–750 nm) via optical parametric amplification. In addition this setup is used to perform pump probe in transmission and reflection (especially for devices) geometry as well as transient absorption microscopy.

 

 

 

 

(3) Two Dimensional Fourier Transform Spectroscopy (2D FTS)

The 2D FTS is performed usTwo Dimensional Fourier Transform Spectroscopying 1 KHz laser system unravel the electronic coupling between different resonances in the material. Dazzler pulse shaper is used in this experiment which can delay, filter, compress, split femtosecond pulses without losing coherence.
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